Efficient products
Customized products for various types of production lines for customers
Continuous increase in production capacity to meet customer needs
| Project | Specifications | Test method |
| Growth pattern | Czochralski Technique | -- |
| Crystallinity | Single crystal | -- |
| Size |
M10：182.2*182.2*φ247mm M10-L：182.2*183.75*φ247mm |
Silicon wafer automatic detection equipment |
| Thickness | 130±8μm | Silicon wafer automatic detection equipment |
| Project | Specifications | Test method |
| Resistivity | 0.4-1.6 Ω.cm | Silicon wafer automatic detection equipment |
| Minority lifespan | ≥1000/μs |
Transient photoconductivity decay method Injection level: 5E14cm-3 (Sinton BCT-400) |
| Oxygen content | ≤6E+17 at/cm³ | FT-IR |
| Carbon content | ≤ 5E+16 at/cm³ | FT-IR |
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